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Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films

✍ Scribed by Dourdain, Sandrine; Bardeau, Jean-François; Colas, Maggy; Smarsly, Bernd; Mehdi, Ahmad; Ocko, Benjamin M.; Gibaud, Alain

No coin nor oath required. For personal study only.

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