Characterization of Ordered Mesoporous Silica Films Using Small-Angle Neutron Scattering and X-ray Porosimetry

✍ Scribed by Vogt, Bryan D.; Pai, Rajaram A.; Lee, Hae-Jeong; Hedden, Ronald C.; Soles, Christopher L.; Wu, Wen-li; Lin, Eric K.; Bauer, Barry J.; Watkins, James J.

• Book ID: 120378948
• Publisher: American Chemical Society
• Year: 2005
• Tongue: English
• Weight: 679 KB
• Volume: 17
• Category: Article
• ISSN: 0897-4756
• DOI: 10.1021/cm048654k