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Radiation damage of mesoporous silica thin films monitored by X-ray reflectivity and scanning electron microscopy

✍ Scribed by S. Dourdain; X. Deschanels; G. Toquer; C. Grygiel; I. Monnet; S. Pellet-Rostaing; A. Grandjean

Book ID: 113731913
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 482 KB
Volume: 427
Category: Article
ISSN: 0022-3115
DOI: 10.1016/j.jnucmat.2012.03.046

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