Surface characterization of a homoepitaxial -FeSi 2 film grown on a -FeSi 2 single crystal synthesized with a temperaturegradient solution method was performed by X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS). The annealing to remove native oxide layers on the crysta
Spectroscopic characterization of β-FeSi2 single crystals and homoepitaxial β-FeSi2 films by XPS and XAS
✍ Scribed by F. Esaka; H. Yamamoto; H. Udono; N. Matsubayashi; K. Yamaguchi; S. Shamoto; M. Magara; T. Kimura
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 392 KB
- Volume
- 257
- Category
- Article
- ISSN
- 0169-4332
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