Optical and electrical characterization of high quality β-FeSi2 thin films grown by solid phase epitaxy

✍ Scribed by D.H. Tassis; C.L. Mitsas; T.T. Zorba; M. Angelakeris; C.A. Dimitriadis; O. Valassiades; D.I. Siapkas; G. Kiriakidis

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 397 KB
• Volume: 102
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(96)00043-8