Deep-level transient spectroscopy (DLTS) measurements performed on Schottky/CulnSe2 diodes are reported. So far, Cd(Zn)S has been used as a window n-type layer to prepare CulnSe2 diodes. The diffusion of such a layer introduced defects into Cd(Zn)S-CulnSe2 diodes. Thus, the importance of using Schot
โฆ LIBER โฆ
Spectra of polycrystalline and single-crystal silicon for solar cells measured by deep-level transient spectroscopy
โ Scribed by S. M. Kikkarin; B. N. Mukashev; M. F. Tamendarov; S. Zh. Tokmoldin
- Book ID
- 110121623
- Publisher
- SP MAIK Nauka/Interperiodica
- Year
- 1997
- Tongue
- English
- Weight
- 35 KB
- Volume
- 23
- Category
- Article
- ISSN
- 1063-7850
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