Distribution of electrically active nickel atoms in silicon crystals measured by means of deep level transient spectroscopy

✍ Scribed by Shuji Tanaka; Hajime Kitagawa

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 207 KB
• Volume: 401-402
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/j.physb.2007.08.125