Strain-relaxation in NH3-source molecula
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Koyama, T. ;Sugawara, M. ;Uchinuma, Y. ;Kaeding, J. F. ;Sharma, R. ;Onuma, T. ;N
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Article
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2006
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John Wiley and Sons
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English
⚖ 228 KB
## Abstract Temporal evolution of surface morphology in AlN epilayers grown by NH~3~‐source molecular beam epitaxy on the GaN/(0001) Al~2~O~3~ epitaxial templates was correlated with changes in the degree of the residual strain and the layer thickness. They began to crack for the thickness as thin