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Spatially-resolved spectroscopic measurements of Ec − 0.57 eV traps in AlGaN/GaN high electron mobility transistors

✍ Scribed by Cardwell, D. W.; Sasikumar, A.; Arehart, A. R.; Kaun, S. W.; Lu, J.; Keller, S.; Speck, J. S.; Mishra, U. K.; Ringel, S. A.; Pelz, J. P.

Book ID: 120349254
Publisher: American Institute of Physics
Year: 2013
Tongue: English
Weight: 945 KB
Volume: 102
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.4806980

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