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Photo-ionization spectroscopy of traps in AlGaN/GaN high-electron mobility transistors

✍ Scribed by M. Wolter; P. Javorka; A. Fox; M. Marso; H. Lüth; P. Kordoš; R. Carius; A. Alam; M. Heuken

Book ID: 107452788
Publisher: Springer US
Year: 2002
Tongue: English
Weight: 140 KB
Volume: 31
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-002-0115-6

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