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Spatial variations of carrier and defect concentration in VGF GaAs:Si

✍ Scribed by Martina Baeumler; Frank Börner; Ulrich Kretzer; Max Scheffer-Czygan; Thomas Bünger; Joachim Wagner

Book ID: 106398002
Publisher: Springer US
Year: 2007
Tongue: English
Weight: 332 KB
Volume: 19
Category: Article
ISSN: 0957-4522
DOI: 10.1007/s10854-007-9532-x

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