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Measurement of carrier concentration by i.r. reflectance: Si and GaAs

✍ Scribed by Vishnu Gopal

Publisher: Elsevier Science
Year: 1981
Weight: 199 KB
Volume: 21
Category: Article
ISSN: 0020-0891
DOI: 10.1016/0020-0891(81)90017-8

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