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Absolute measurement of transient carrier concentration and temperature gradients in power semiconductor devices by internal IR-laser deflection

✍ Scribed by G. Deboy; G. Sölkner; E. Wolfgang; W. Claeys


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
503 KB
Volume
31
Category
Article
ISSN
0167-9317

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