Carrier concentration and minority carrier lifetime measurement in semiconductor epitaxial by the MOS capacitance method : C. Jund and R. Poirier, Solid-St. Electron.9 (1966), pp. 315–319

• Publisher: Elsevier Science
• Year: 1967
• Tongue: English
• Weight: 108 KB
• Volume: 6
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(67)90053-4