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Carrier concentration and minority carrier lifetime measurement in semiconductor epitaxial by the MOS capacitance method : C. Jund and R. Poirier, Solid-St. Electron.9 (1966), pp. 315–319


Publisher
Elsevier Science
Year
1967
Tongue
English
Weight
108 KB
Volume
6
Category
Article
ISSN
0026-2714

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