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Some results of a study of the SiO2-Si interface using the thermally stimulated charge release

✍ Scribed by Pieper, H.

Publisher: John Wiley and Sons
Year: 1974
Tongue: English
Weight: 150 KB
Volume: 23
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210230153

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