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Thermally stimulated field emission of charge from traps in the transition layer of SiSiO2 structures

✍ Scribed by Yu.V. Gomeniuk; R.N. Litovski; V.S. Lysenko; I.N. Osiyuk; I.P. Tyagulski

No coin nor oath required. For personal study only.

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Current stochasticity of field emission

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Thermal energy depth of electron traps i

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AES and USXES investigations of the phas

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