Current stochasticity of field emission of charge from traps in the transition layer of implanted MIS structures

✍ Scribed by Yu.V. Gomeniuk; R.N. Litovski; V.S. Lysenko; I.N. Osiyuk; I.P. Tyagulski

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 417 KB
• Volume: 59
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(92)90292-6