Soft Error Mechanisms, Modeling and Mitigation

✍ Scribed by Selahattin Sayil (auth.)

• Publisher: Springer International Publishing
• Year: 2016
• Tongue: English
• Leaves: 112
• Edition: 1
• Category: Library

✦ Synopsis

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.

✦ Table of Contents

Front Matter....Pages i-xi
Introduction....Pages 1-10
Mitigation of Single Event Effects....Pages 11-18
Transmission Gate (TG) Based Soft Error Mitigation Methods....Pages 19-30
Single Event Soft Error Mechanisms....Pages 31-48
Modeling Single Event Crosstalk Noise in Nanometer Technologies....Pages 49-62
Modeling of Single Event Coupling Delay and Speedup Effects....Pages 63-74
Single Event Upset Hardening of Interconnects....Pages 75-84
Soft-Error Aware Power Optimization....Pages 85-93
Dynamic Threshold Technique for Soft Error and Soft Delay Mitigation....Pages 95-103
Back Matter....Pages 105-105

✦ Subjects

Circuits and Systems;Electronic Circuits and Devices;Processor Architectures