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Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances

โœ Scribed by Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu (auth.)


Publisher
Springer-Verlag New York
Year
2011
Tongue
English
Leaves
230
Edition
1
Category
Library

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โœฆ Synopsis


Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances by: Nobuyasu Kanekawa Eishi H. Ibe Takashi Suga Yutaka Uematsu The importance of โ€œdependabilityโ€ in electronic systems is obvious, especially in safety-critical or mission-critical applications. Dependability hinges on matters such as failure causes and countermeasures for soft/hard -errors in semiconductor devices, electro-magnetic interferences, power integration, and system architecture. This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability. โ€ขProvides a set of valuable techniques to design dependability into embedded systems; โ€ขOffers fault mitigation techniques widely applicable in general control systems in space and ground-based transportation systems; โ€ขPresents fundamentals of soft-errors in semiconductor devices and their impacts and countermeasures in electronic systems such as network servers and routers; โ€ขDescribes fundamentals of electro-magnetic interference and practical countermeasures in many industrial applications; โ€ขDiscusses vulnerability in power supply systems and how power integration is accomplished.

โœฆ Table of Contents


Front Matter....Pages i-xxv
Introduction....Pages 1-6
Terrestrial Neutron-Induced Failures in Semiconductor Devices and Relevant Systems and Their Mitigation Techniques....Pages 7-63
Electromagnetic Compatibility....Pages 65-89
Power Integrity....Pages 91-142
Fault-Tolerant System Technology....Pages 143-200
Challenges in the Future....Pages 201-202
Back Matter....Pages 203-204

โœฆ Subjects


Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design


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