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Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

✍ Scribed by Heidel, David F.; Marshall, Paul W.; Pellish, Jonathan A.; Rodbell, Kenneth P.; LaBel, Kenneth A.; Schwank, James R.; Rauch, Stewart E.; Hakey, Mark C.; Berg, Melanie D.; Castaneda, Carlos M.; Dodd, Paul E.; Friendlich, Mark R.; Phan, Anthony D.; Seidleck, Christina M.; Shaneyfelt, Marty R.; Xapsos, Michael A.

Book ID: 118049184
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 660 KB
Volume: 56
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.2009.2033796

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