Parametric Variability Affecting 45 nm SOI SRAM Single Event Upset Cross-Sections

✍ Scribed by Loveless, Thomas Daniel; Alles, Michael L.; Ball, Dennis R.; Warren, Kevin M.; Massengill, Lloyd W.

• Book ID: 119950453
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 755 KB
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2010.2081688