Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

✍ Scribed by Heidel, David F.; Marshall, Paul W.; LaBel, Kenneth A.; Schwank, James R.; Rodbell, Kenneth P.; Hakey, Mark C.; Berg, Melanie D.; Dodd, Paul E.; Friendlich, Mark R.; Phan, Anthony D.; Seidleck, Christina M.; Shaneyfelt, Marty R.; Xapsos, Michael A.

• Book ID: 121322368
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 565 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2008.2005499