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The Impact of Delta-Rays on Single-Event Upsets in Highly Scaled SOI SRAMs

✍ Scribed by King, Michael P.; Reed, Robert A.; Weller, Robert A.; Mendenhall, Marcus H.; Schrimpf, Ronald D.; Alles, Michael L.; Auden, Elizabeth C.; Armstrong, Sarah E.; Asai, Makoto

Book ID: 119950457
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 639 KB
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2010.2085019

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