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[IEEE RADECS 2001. 2001 6th European Conference on Radiation and its Effects on Components and Systems - Grenoble, France (10-14 Sept. 2001)] RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) - Observation of changes in the single event upset rate in 4MB SRAM due to intervening materials in a neutron environment

✍ Scribed by Wilkins, R.; Huff, H.; Badhwar, G.D.; Moore, J.; Zhou, J.; Singleterry, R.C.; Wender, S.A.; Fogarty, T.N.

Book ID: 125844132
Publisher: IEEE
Year: 2002
Weight: 278 KB
Category: Article
ISBN-13: 9780780373136
DOI: 10.1109/RADECS.2001.1159325

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