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Single-event upset and snapback in silicon-on-insulator devices and integrated circuits

✍ Scribed by Dodd, P.E.; Shaneyfelt, M.R.; Walsh, D.S.; Schwank, J.R.; Hash, G.L.; Loemker, R.A.; Draper, B.L.; Winokur, P.S.

Book ID: 119959232
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 162 KB
Volume: 47
Category: Article
ISSN: 0018-9499
DOI: 10.1109/23.903749

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