Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

✍ Scribed by Dodd, P. E.; Schwank, J. R.; Shaneyfelt, M. R.; Felix, J. A.; Paillet, P.; Ferlet-Cavrois, V.; Baggio, J.; Reed, R. A.; Warren, K. M.; Weller, R. A.

• Book ID: 115523592
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 233 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2007.909844