✦ LIBER ✦

Modeling Single-Event Upsets in 65-nm Silicon-on-Insulator Semiconductor Devices

✍ Scribed by KleinOsowski, AJ; Oldiges, Phil; Williams, Richard Q.; Solomon, Paul M.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Low-Energy Proton-Induced Single-Event-U

✍ Rodbell, Kenneth P.; Heidel, David F.; Tang, Henry H. K.; Gordon, Michael S.; Ol 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 337 KB

Single-Event-Upset Critical Charge Measu

✍ Heidel, David F.; Rodbell, Kenneth P.; Oldiges, Phil; Gordon, Michael S.; Tang, 📂 Article 📅 2006 🏛 IEEE 🌐 English ⚖ 291 KB

On-Chip Measurement of Single-Event Tran

✍ Loveless, T. D.; Kauppila, J. S.; Jagannathan, S.; Ball, D. R.; Rowe, J. D.; Gas 📂 Article 📅 2012 🏛 IEEE 🌐 English ⚖ 940 KB

[IEEE 2012 International Conference on O

✍ Wang, Tianqi; Xiao, Liyi; Huang, Qingfeng 📂 Article 📅 2012 🏛 IEEE ⚖ 785 KB