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Single Event Effect Analysis on DC and RF Operated AlGaN/GaN HEMTs

✍ Scribed by Rostewitz, M.; Hirche, K.; Latti, J.; Jutzi, E.

Book ID: 121822833
Publisher: IEEE
Year: 2013
Tongue: English
Weight: 782 KB
Volume: 60
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2013.2247774

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