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Analysis of GaN HEMT Failure Mechanisms During DC and Large-Signal RF Operation

✍ Scribed by Chini, A.; Di Lecce, V.; Fantini, F.; Meneghesso, G.; Zanoni, E.

Book ID: 114620939
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 934 KB
Volume: 59
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2012.2188636

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