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Silicon Nanowire Tunnel FETs: Low-Temperature Operation and Influence of High- Gate Dielectric

โœ Scribed by Moselund, K.E.; Bjork, M.T.; Schmid, H.; Ghoneim, H.; Karg, S.; Lortscher, E.; Riess, W.; Riel, H.


Book ID
114620599
Publisher
IEEE
Year
2011
Tongue
English
Weight
525 KB
Volume
58
Category
Article
ISSN
0018-9383

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