✦ LIBER ✦
Comparison of low-temperature electrical characteristics of gate-all-around nanowire FETs, Fin FETs and fully-depleted SOI FETs
✍ Scribed by Kiichi Tachi; Sylvain Barraud; Kuniyuki Kakushima; Hiroshi Iwai; Sorin Cristoloveanu; Thomas Ernst
- Book ID
- 108210928
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 514 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0026-2714
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