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Silicate formation at the interface of Pr-oxide as a high-K dielectric and Si(001) surfaces

✍ Scribed by D. Schmeißer; F. Zheng; V. Perez-Dieste; F.J. Himpsel; R. LoNigro; R.G. Toro; G. Malandrino; I.L. Fragalà

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 151 KB
Volume: 26
Category: Article
ISSN: 0928-4931
DOI: 10.1016/j.msec.2005.09.104

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