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Sidewall defects of AlGaN/GaN HEMTs evaluated by low frequency noise analysis

✍ Scribed by Chiu, Hsien-Chin; Chen, Chao-Hung; Kao, Hsuan-Ling; Chien, Feng-Tso; Weng, Ping-Kuo; Gau, Yan-Tang; Chuang, Hao-Wei

Book ID: 121884904
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 597 KB
Volume: 53
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2013.06.015

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