AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements

✍ Scribed by A. Sozza; A. Curutchet; C. Dua; N. Malbert; N. Labat; A. Touboul

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 759 KB
• Volume: 46
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2006.07.062