✦ LIBER ✦
Comparison of photo- and plasma-assisted passivating process effects on GaAs devices by means of low-frequency noise measurements
✍ Scribed by P. Gottwald; R. Riemenschneider; B. Szentpali; H.L. Hartnagel; Zs. Kincses; M. Ruszinko
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 422 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0038-1101
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