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Low frequency noise and screening effects in AlGaN/GaN HEMTs

✍ Scribed by Garrido, J.A.; Calle, F.; Muñoz, E.; Izpura, I.; Sánchez-Rojas, J.L.; Li, R.; Wang, K.L.

Book ID: 124083344
Publisher: The Institution of Electrical Engineers
Year: 1998
Tongue: English
Weight: 402 KB
Volume: 34
Category: Article
ISSN: 0013-5194
DOI: 10.1049/el:19981597

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