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Sensitivity of X-ray diffractometry for strain depth profiling in III–V heterostructures

✍ Scribed by Bensoussan, S. ;Malgrange, C. ;Sauvage-Simkin, M.

Book ID: 114500025
Publisher: International Union of Crystallography
Year: 1987
Tongue: English
Weight: 819 KB
Volume: 20
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s0021889887086801

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