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An automatic analysis of strain-depth profile in X-ray microdiffraction

✍ Scribed by S. Lagomarsino; C. Giannini; A. Guagliardi; A. Cedola; F. Scarinci; C. Aruta

Book ID: 108238622
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 295 KB
Volume: 353
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2004.09.065

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