✦ LIBER ✦
Improved model for the determination of strain fields and chemical composition of semiconductor heterostructures by high-resolution X-ray diffractometry
✍ Scribed by L Tapfer; L De Caro; C Giannini; H.-P Schönherr; K.H Ploog
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 497 KB
- Volume
- 98
- Category
- Article
- ISSN
- 0038-1098
No coin nor oath required. For personal study only.