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Secondary ion emission from metal targets under carbon trifluoride ion (CF3+) and oxygen ion (O2+) bombardment

โœ Scribed by Reuter, Wilhad.


Book ID
126125468
Publisher
American Chemical Society
Year
1987
Tongue
English
Weight
923 KB
Volume
59
Category
Article
ISSN
0003-2700

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A series of ionic and neutral Group VIII transition metal complexes with molecular masses up to 2500 u were analysed by time-of-flight secondary ion mass spectrometry (SIMS) and plasma desorption mass spectrometry (PDMS). The secondary ion emission, the secondary ion yields and the yield ratios Y(PD