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Secondary ion emission from silicon under 8 keV O2+ and Ar+ ion bombardment

โœ Scribed by CHA Huan; ATS Wee; HSM Low; KL Tan


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
1008 KB
Volume
47
Category
Article
ISSN
0042-207X

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โœ Herbert Feld; Derk Rading; Angelika Leute; Alfred Benninghoven ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 979 KB

A series of ionic and neutral Group VIII transition metal complexes with molecular masses up to 2500 u were analysed by time-of-flight secondary ion mass spectrometry (SIMS) and plasma desorption mass spectrometry (PDMS). The secondary ion emission, the secondary ion yields and the yield ratios Y(PD