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Comparative investigations of the secondary ion emission of metal complexes under MeV and keV ion bombardment

✍ Scribed by Herbert Feld; Derk Rading; Angelika Leute; Alfred Benninghoven

Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
979 KB
Volume
28
Category
Article
ISSN
1076-5174

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✦ Synopsis

A series of ionic and neutral Group VIII transition metal complexes with molecular masses up to 2500 u were analysed by time-of-flight secondary ion mass spectrometry (SIMS) and plasma desorption mass spectrometry (PDMS). The secondary ion emission, the secondary ion yields and the yield ratios Y(PDMS)/Y(SIMS) of 20 ionic and neutral metal complexes were determined. Both techniques generally provide both molecular and fragment ion information. Characteristic fragmentation patterns give useful data for structural cbaracterization. Additionally, the stabilities of different secondary ion species were compared by their half-lives. Both PDMS and SIMS are very sensitive, yielding optimum spectra from total sample sizes as low as 5 nmol, and the sample consumption is negligible.

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