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A comparative study of primary ion energy dependence of secondary ion yields from Si and Ge surfaces under inert and reactive ion bombardment

✍ Scribed by Nandini Ray; P. Rajasekar; S.D. Dey

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A SIMS study of embedded primary atom (A

✍ Nandini Ray; P. Rajasekar; S.D. Dey 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 419 KB

Measurements of relative secondary ion y

✍ A. Benninghoven; C. Plog; N. Treitz 📂 Article 📅 1974 🏛 Elsevier Science ⚖ 672 KB

Comparative study of Si(111), silicon ox

✍ A. Benninghoven; W. Sichtermann; S. Storp 📂 Article 📅 1975 🏛 Elsevier Science 🌐 English ⚖ 253 KB

Target current density effects on the yi

✍ Nandini Ray; P Rajasekar; SD Dey 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 510 KB