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A SIMS study of embedded primary atom (Ar+ and Ne+) signals from Si and Ge surfaces under intense ion bombardment

✍ Scribed by Nandini Ray; P. Rajasekar; S.D. Dey


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
419 KB
Volume
227
Category
Article
ISSN
0022-3115

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