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Secondary ion emission and sputter yields from metal targets under fluorine ion (F2+) bombardment

โœ Scribed by Reuter, Wilhad.; Clabes, J. G.


Book ID
126904350
Publisher
American Chemical Society
Year
1988
Tongue
English
Weight
598 KB
Volume
60
Category
Article
ISSN
0003-2700

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A series of ionic and neutral Group VIII transition metal complexes with molecular masses up to 2500 u were analysed by time-of-flight secondary ion mass spectrometry (SIMS) and plasma desorption mass spectrometry (PDMS). The secondary ion emission, the secondary ion yields and the yield ratios Y(PD