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A comparison of secondary ion emission from polycrystalline metals under MeV and keV heavy ion bombardment

โœ Scribed by John P. O'Connor; Patricia G. Blauner; Robert A. Weller


Book ID
113277177
Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
631 KB
Volume
7-8
Category
Article
ISSN
0168-583X

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A series of ionic and neutral Group VIII transition metal complexes with molecular masses up to 2500 u were analysed by time-of-flight secondary ion mass spectrometry (SIMS) and plasma desorption mass spectrometry (PDMS). The secondary ion emission, the secondary ion yields and the yield ratios Y(PD