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Comparison of secondary ion emission induced in silicon oxide by MeV and keV ion bombardment

✍ Scribed by H. Allali; B. Nsouli; J.-P. Thomas; W. Szymczak; K. Wittmaack

Book ID
113285636
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
444 KB
Volume
90
Category
Article
ISSN
0168-583X

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