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Screening of variables for the empirical modelling of semiconductor devices

✍ Scribed by Sprevak, D.; Ferguson, R.S.; Walton, A.J.; Fallen, N.; Newsam, M.I.


Book ID
114456887
Publisher
The Institution of Electrical Engineers
Year
1996
Tongue
English
Weight
745 KB
Volume
143
Category
Article
ISSN
1350-2344

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