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A variable temperature test station for extraction of semiconductor device modeling parameters

✍ Scribed by Siergiej, R.R.; Krutsick, T.J.; White, M.H.

Book ID: 114545057
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 579 KB
Volume: 37
Category: Article
ISSN: 0018-9456
DOI: 10.1109/19.9824

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