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A model for failure in the contact system of a semiconductor device on temperature cycling

✍ Scribed by L. V. Bereza; A. A. Dolgov; V. G. Doroshenko; V. M. Evdokimov; A. I. Elizarova; M. B. Zaks; Yu. V. Skokov

Publisher: Springer US
Year: 1983
Tongue: English
Weight: 329 KB
Volume: 44
Category: Article
ISSN: 1573-871X
DOI: 10.1007/bf00826151

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